Our laboratory maintains a suite of instruments for thin-film deposition, magnetic imaging, surface characterization, and structural analysis — supporting in-house projects and collaborations with partner groups.
High-resolution imaging of surface morphology, lateral force mapping, and conductive-AFM measurements for electrically-driven domain manipulation in 2D magnetic materials.
Visualizes magnetic domain structure, domain-wall motion, and hysteresis loops with sub-micron resolution. Used extensively for hydrogen-induced domain dynamics studies.
Growth of 2D materials (graphene, hBN, TMDs) and oxide thin films on various substrates for heterostructure fabrication and interface studies.
Electron-beam evaporation in UHV environment for clean, layer-controlled growth of magnetic thin films, multilayers, and alloy systems with sub-monolayer precision.
Vibrational spectroscopy for material identification, layer-number determination in 2D materials, strain/doping analysis, and photoluminescence characterization.
Quantitative magnetization measurements (M–H loops, M–T curves) across temperature and magnetic field ranges — the workhorse for characterizing new magnetic samples.